Hall Effect Testing

PMIC uses ASTM F76 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Measuring electrical resistivity under an applied magnetic field supplies information about the carrier concentration, Hall mobility, and majority carrier type of a semiconductor. PMIC has performed Hall Effect testing up to 523 K (250 °C) by partnering with the Oregon State University Magnetics Laboratory. Room temperature testing can be performed with Ø 101.6 mm (4.0”) poles and Ø 50.8 mm (2.0”) poles at magnetic field strengths between ±8 Gauss and ±15 Gauss, respectively.